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CA-BIST for asynchronous circuits: A case study on the RAPPID asynchronous instruction length decoder


Author(s) : Parimal Pal Chaudhuri Shai Rotem Rajesh Pendurkar Ken Stevens Marly Roncken Pentium R, 
Publisher : N/A
Publication Date : 2000
ISSN : N/A
Abstract : This paper presents a case study in low-cost noninvasive Built-In Self Test (BIST) for RAPPID, a largescale 120,000-transistor asynchronous version of the,