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A class-based clustering static compaction technique for combinational circuits


Author(s) : Yahya E. Osais Aiman H. El-Maleh, Y.E. Osais A.H. El-Maleh, 
Publisher : N/A
Publication Date : 2004
ISSN : N/A
Abstract : Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before it is processed. In this way, a test vector that is originally incompatible with all other test vectors in a given test set can be eliminated if its components can be merged with other test vectors., Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before it is processed. In this way, a test vector that is originally incompatible with all other test vectors in a given test set can be eliminated if its components can be merged with other test vectors.,